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| Presentation | 2017-10-06 16:15 A study of estimation by sparse coding of dislocation regions in photoluminescence image of multicrystalline silicon Hiroaki Kudo, Yusuke Hayama, Tetsuya Matsumoto (Nagoya Univ.), Kentaro Kutsukake (Tohoku Univ.), Noritaka Usami (Nagoya Univ.)  IMQ2017-19 |
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| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | Increasing attention has been focused on a structure control of multicrystalline silicon wafers. In this report, we studied a specified method of regions including dislocations in a photoluminescence (PL) image of such wafers. We utilized a method based on a sparse coding algorithm which reconstructed the image. We assumed regions of dislocations caused large represent errors and presented darker colors. A mixture matrix of independent component analysis (ICA) for the original image was used as bases of a sparse coding. From characteristics of represented errors of an analysis of ROC curves, we confirmed performances of the proposed method. | |
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | multicrystalline silicon / photoluminescence image / dislocation / sparse coding / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 117, no. 229, IMQ2017-19, pp. 29-34, Oct. 2017. | |
| Paper # | IMQ2017-19 | |
| Date of Issue | 2017-09-29 (IMQ) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | IMQ2017-19 |
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| Conference Information | |
| Committee | IMQ |
| Conference Date | 2017-10-06 - 2017-10-06 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | Kobe Univesity |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Image Processing, etc. |
| Paper Information | |
| Registration To | IMQ |
| Conference Code | 2017-10-IMQ |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A study of estimation by sparse coding of dislocation regions in photoluminescence image of multicrystalline silicon |
| Sub Title (in English) | |
| Keyword(1) | multicrystalline silicon |
| Keyword(2) | photoluminescence image |
| Keyword(3) | dislocation |
| Keyword(4) | sparse coding |
| Keyword(5) | |
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| 1st Author's Name | Hiroaki Kudo |
| 1st Author's Affiliation | Nagoya University (Nagoya Univ.) |
| 2nd Author's Name | Yusuke Hayama |
| 2nd Author's Affiliation | Nagoya University (Nagoya Univ.) |
| 3rd Author's Name | Tetsuya Matsumoto |
| 3rd Author's Affiliation | Nagoya University (Nagoya Univ.) |
| 4th Author's Name | Kentaro Kutsukake |
| 4th Author's Affiliation | Tohoku University (Tohoku Univ.) |
| 5th Author's Name | Noritaka Usami |
| 5th Author's Affiliation | Nagoya University (Nagoya Univ.) |
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| Speaker | Author-1 |
| Date Time | 2017-10-06 16:15:00 |
| Presentation Time | 25 minutes |
| Registration for | IMQ |
| Paper # | IMQ2017-19 |
| Volume (vol) | vol.117 |
| Number (no) | no.229 |
| Page | pp.29-34 |
| #Pages | 6 |
| Date of Issue | 2017-09-29 (IMQ) |
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