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Paper Abstract and Keywords
Presentation 2017-08-02 09:30
[Invited Talk] SAR A/D Converter Using Stochastic Conversion and Machine-Learning Error Correction
Toshimasa Matsuoka (Osaka Univ.), Takatsugu Kamata, Masayuki Ueda (SPChange), Yusaku Hirai, Sadahiro Tani, Tomohiro Asano, Shodai Isami, Toshifumi Kurata, Keiji Tatsumi (Osaka Univ.) SDM2017-42 ICD2017-30 Link to ES Tech. Rep. Archives: SDM2017-42 ICD2017-30
Abstract (in Japanese) (See Japanese page) 
(in English) To realize daily life health care and telemedicine utilizing ICT infrastructure of the mobile cloud environment, wearable biomedical information sensing devices and ICT techniques are required to be popularized. Overlooking the whole system, we are developing low-power high-precision analog front-end (AFE) IC embedding
machine-learning error correction function, which uses a successive-approximation-register A/D converter with stochastic A/D conversion as a promising circuit technique. This paper describes design and evaluation results of the proto-type AFE IC.
Keyword (in Japanese) (See Japanese page) 
(in English) SAR-ADC / DAC error calibration / stochastic A/D conversion / mismatch / machine learning / / /  
Reference Info. IEICE Tech. Rep., vol. 117, no. 167, ICD2017-30, pp. 95-100, July 2017.
Paper # ICD2017-30 
Date of Issue 2017-07-24 (SDM, ICD) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF SDM2017-42 ICD2017-30 Link to ES Tech. Rep. Archives: SDM2017-42 ICD2017-30

Conference Information
Committee SDM ICD ITE-IST  
Conference Date 2017-07-31 - 2017-08-02 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido-Univ. Multimedia Education Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Analog, Mixed Analog and Digital, RF, and Sensor Interface, Low voltage/low power techniques, novel devices, circuits, and applications 
Paper Information
Registration To ICD 
Conference Code 2017-07-SDM-ICD-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) SAR A/D Converter Using Stochastic Conversion and Machine-Learning Error Correction 
Sub Title (in English)  
Keyword(1) SAR-ADC  
Keyword(2) DAC error calibration  
Keyword(3) stochastic A/D conversion  
Keyword(4) mismatch  
Keyword(5) machine learning  
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Keyword(7)  
Keyword(8)  
1st Author's Name Toshimasa Matsuoka  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Takatsugu Kamata  
2nd Author's Affiliation SPChange (SPChange)
3rd Author's Name Masayuki Ueda  
3rd Author's Affiliation SPChange (SPChange)
4th Author's Name Yusaku Hirai  
4th Author's Affiliation Osaka University (Osaka Univ.)
5th Author's Name Sadahiro Tani  
5th Author's Affiliation Osaka University (Osaka Univ.)
6th Author's Name Tomohiro Asano  
6th Author's Affiliation Osaka University (Osaka Univ.)
7th Author's Name Shodai Isami  
7th Author's Affiliation Osaka University (Osaka Univ.)
8th Author's Name Toshifumi Kurata  
8th Author's Affiliation Osaka University (Osaka Univ.)
9th Author's Name Keiji Tatsumi  
9th Author's Affiliation Osaka University (Osaka Univ.)
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Speaker Author-1 
Date Time 2017-08-02 09:30:00 
Presentation Time 45 minutes 
Registration for ICD 
Paper # SDM2017-42, ICD2017-30 
Volume (vol) vol.117 
Number (no) no.166(SDM), no.167(ICD) 
Page pp.95-100 
#Pages
Date of Issue 2017-07-24 (SDM, ICD) 


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