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Paper Abstract and Keywords
Presentation 2015-12-03 10:50
On Correction of Temperature Influence to Delay Measurement in FPGAs
Takeru Kina, Yousuke Miyake, Yasuo Sato, Seiji Kajihara (KIT) VLD2015-63 DC2015-59
Abstract (in Japanese) (See Japanese page) 
(in English) As a means for delay testing for VLSIs in field, a measurement method of a path delay for a logic circuit using variable test timing has been proposed. However, the measured delay in the field is varied by temperature at test, because the temperature affects the circuit delay in the chip. Correction of influence by temperature variation upon the delay is required in order to compare the measured delay at different times. In this paper, the influence of the temperature during testing on the measured delay value is evaluated using a delay measurement circuit in an FPGA. Then, this paper proposes a correction technique of temperature influence on the measured delay using on-chip delay measurement, in order to realize delay measurement which does not depend on the temperature during testing in the field.
Keyword (in Japanese) (See Japanese page) 
(in English) FPGA / Logic BIST / Delay measurement / Variable test timing / / / /  
Reference Info. IEICE Tech. Rep., vol. 115, no. 339, DC2015-59, pp. 165-170, Dec. 2015.
Paper # DC2015-59 
Date of Issue 2015-11-24 (VLD, DC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
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All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF VLD2015-63 DC2015-59

Conference Information
Committee VLD DC IPSJ-SLDM CPSY RECONF ICD CPM  
Conference Date 2015-12-01 - 2015-12-03 
Place (in Japanese) (See Japanese page) 
Place (in English) Nagasaki Kinro Fukushi Kaikan 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Design Gaia 2015 -New Field of VLSI Design- 
Paper Information
Registration To DC 
Conference Code 2015-12-VLD-DC-SLDM-CPSY-RECONF-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) On Correction of Temperature Influence to Delay Measurement in FPGAs 
Sub Title (in English)  
Keyword(1) FPGA  
Keyword(2) Logic BIST  
Keyword(3) Delay measurement  
Keyword(4) Variable test timing  
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1st Author's Name Takeru Kina  
1st Author's Affiliation Kyushu Institute of Technology (KIT)
2nd Author's Name Yousuke Miyake  
2nd Author's Affiliation Kyushu Institute of Technology (KIT)
3rd Author's Name Yasuo Sato  
3rd Author's Affiliation Kyushu Institute of Technology (KIT)
4th Author's Name Seiji Kajihara  
4th Author's Affiliation Kyushu Institute of Technology (KIT)
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Speaker Author-1 
Date Time 2015-12-03 10:50:00 
Presentation Time 25 minutes 
Registration for DC 
Paper # VLD2015-63, DC2015-59 
Volume (vol) vol.115 
Number (no) no.338(VLD), no.339(DC) 
Page pp.165-170 
#Pages
Date of Issue 2015-11-24 (VLD, DC) 


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