IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2014-09-01 17:00
Analysing the Fairness of Fairness-aware Classifiers
Toshihiro Kamishima, Shotaro Akaho, Hideki Asoh (AIST), Jun Sakuma (Univ. of Tsukuba) PRMU2014-47 IBISML2014-28
Abstract (in Japanese) (See Japanese page) 
(in English) Calders and Verwer's two-naive-Bayes is one of fairness-aware classifiers, which classify objects while excluding the influence of a specific information. We analyze why this classifier achieves very high level of the fairness, and show that this is due to a decision rules and a model bias. Based on these findings, we develop methods that are grounded on rigid theory and are applicable to wider types of classifiers.
Keyword (in Japanese) (See Japanese page) 
(in English) fairness-aware data mining / discrimination-aware data mining / naive Bayes classifier / / / / /  
Reference Info. IEICE Tech. Rep., vol. 114, no. 198, IBISML2014-28, pp. 85-92, Sept. 2014.
Paper # IBISML2014-28 
Date of Issue 2014-08-25 (PRMU, IBISML) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF PRMU2014-47 IBISML2014-28

Conference Information
Committee PRMU IBISML IPSJ-CVIM  
Conference Date 2014-09-01 - 2014-09-02 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To IBISML 
Conference Code 2014-09-PRMU-IBISML-CVIM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Analysing the Fairness of Fairness-aware Classifiers 
Sub Title (in English)  
Keyword(1) fairness-aware data mining  
Keyword(2) discrimination-aware data mining  
Keyword(3) naive Bayes classifier  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Toshihiro Kamishima  
1st Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST) (AIST)
2nd Author's Name Shotaro Akaho  
2nd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST) (AIST)
3rd Author's Name Hideki Asoh  
3rd Author's Affiliation National Institute of Advanced Industrial Science and Technology (AIST) (AIST)
4th Author's Name Jun Sakuma  
4th Author's Affiliation University of Tsukuba (Univ. of Tsukuba)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2014-09-01 17:00:00 
Presentation Time 30 minutes 
Registration for IBISML 
Paper # PRMU2014-47, IBISML2014-28 
Volume (vol) vol.114 
Number (no) no.197(PRMU), no.198(IBISML) 
Page pp.85-92 
#Pages
Date of Issue 2014-08-25 (PRMU, IBISML) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan