講演抄録/キーワード |
講演名 |
2012-06-22 16:10
On Per-Cell Dynamic IR-Drop Estimation in At-Speed Scan Testing ○Yuta Yamato・Tomokazu Yoneda・Kazumi Hatayama・Michiko Inoue(NAIST) DC2012-15 |
抄録 |
(和) |
(まだ登録されていません) |
(英) |
It is well known that dynamic IR-drop analysis consumes large amount of time even for a few clock cycles. This paper addresses this issue with a novel per-cell dynamic IR-drop estimation method. Instead of performing time-consuming IR-drop analysis for each clock cycle one by one, the proposed method uses global cycle average power profile for each cycle and dynamic IR-drop profiles for a few representative cycles, thus total computation time is effectively reduced. Experimental results on a benchmark circuit demonstrate that the proposed method achieves both high accuracy and high time-efficiency. |
キーワード |
(和) |
/ / / / / / / |
(英) |
IR-drop / Scan testing / Test-induced yield loss / / / / / |
文献情報 |
信学技報, vol. 112, no. 102, DC2012-15, pp. 39-44, 2012年6月. |
資料番号 |
DC2012-15 |
発行日 |
2012-06-15 (DC) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
著作権に ついて |
技術研究報告に掲載された論文の著作権は電子情報通信学会に帰属します.(許諾番号:10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
PDFダウンロード |
DC2012-15 |