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Paper Abstract and Keywords
Presentation 2012-06-21 17:40
Control of junction property at the diamond/metal interface -- The present results and problems of p-type and n-type diamond --
Tsubasa Matsumoto (Tsukuba Univ.), Hiromitsu Kato, Masahiko Ogura, Daisuke Takeuchi, Toshiharu Makino, Hideyo Okushi, Satoshi Yamasaki (AIST)
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Reference Info. IEICE Tech. Rep., vol. 112, no. 92, SDM2012-62, pp. 103-108, June 2012.
Paper # SDM2012-62 
Date of Issue 2012-06-14 (SDM) 

Conference Information
Committee SDM  
Conference Date 2012-06-21 - 2012-06-21 
Place (in Japanese) (See Japanese page) 
Place (in English) VBL, Nagoya Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Science and Technology for Dielectric Thin Films for Electron Devices 
Paper Information
Registration To SDM 
Conference Code 2012-06-SDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Control of junction property at the diamond/metal interface 
Sub Title (in English) The present results and problems of p-type and n-type diamond 
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1st Author's Name Tsubasa Matsumoto  
1st Author's Affiliation University of Tsukuba (Tsukuba Univ.)
2nd Author's Name Hiromitsu Kato  
2nd Author's Affiliation national institute of Advanced Industrial Science and Technology (AIST)
3rd Author's Name Masahiko Ogura  
3rd Author's Affiliation national institute of Advanced Industrial Science and Technology (AIST)
4th Author's Name Daisuke Takeuchi  
4th Author's Affiliation national institute of Advanced Industrial Science and Technology (AIST)
5th Author's Name Toshiharu Makino  
5th Author's Affiliation national institute of Advanced Industrial Science and Technology (AIST)
6th Author's Name Hideyo Okushi  
6th Author's Affiliation national institute of Advanced Industrial Science and Technology (AIST)
7th Author's Name Satoshi Yamasaki  
7th Author's Affiliation national institute of Advanced Industrial Science and Technology (AIST)
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Speaker 1 
Date Time 2012-06-21 17:40:00 
Presentation Time 20 
Registration for SDM 
Paper # IEICE-SDM2012-62 
Volume (vol) IEICE-112 
Number (no) no.92 
Page pp.103-108 
#Pages IEICE-6 
Date of Issue IEICE-SDM-2012-06-14 

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