Paper Abstract and Keywords |
Presentation |
2012-05-30 16:20
[Invited Talk]
How to Mitigate Reliability-related Issues on Nano-scaled LSIs Kazutoshi Kobayashi (KIT) VLD2012-5 |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
According to aggressive process scaling, reliability issues on
semiconductor devices are becoming dominant such as variability,
temporal failure and aging degradation. Variability is related to the
device fabrication process. Timing margins at design time should be
enlarged as the fluctuation of transistor performance. It may diminish
the performance enhancement from process scaling. Temporal failures
are mainly caused by alpha particles from packages or neutrons from
outer space. These particles generate electron-hole pairs to flip
memory or flip-flops, which is so-called soft errors. Redundant
circuits are commonly utilized to mitigate soft errors. Aging
degradation is mainly caused by BTI (Bias Temperature Instability). In
BTI, transistors are degraded or recovered according to the stress
history on the gate bias. We introduce several mitigation techniques
based on the measurement results. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Reliability / Variability / Soft Error / Temporal Failure / Aging Degradation / BTI / / |
Reference Info. |
IEICE Tech. Rep., vol. 112, no. 71, VLD2012-5, pp. 25-30, May 2012. |
Paper # |
VLD2012-5 |
Date of Issue |
2012-05-23 (VLD) |
ISSN |
Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 |
Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
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VLD2012-5 |
Conference Information |
Committee |
IPSJ-SLDM VLD |
Conference Date |
2012-05-30 - 2012-05-31 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kitakyushu International Conference Center |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
System Design, etc. |
Paper Information |
Registration To |
VLD |
Conference Code |
2012-05-SLDM-VLD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
How to Mitigate Reliability-related Issues on Nano-scaled LSIs |
Sub Title (in English) |
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Keyword(1) |
Reliability |
Keyword(2) |
Variability |
Keyword(3) |
Soft Error |
Keyword(4) |
Temporal Failure |
Keyword(5) |
Aging Degradation |
Keyword(6) |
BTI |
Keyword(7) |
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Keyword(8) |
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1st Author's Name |
Kazutoshi Kobayashi |
1st Author's Affiliation |
Kyoto Institute of Technology (KIT) |
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Speaker |
Author-1 |
Date Time |
2012-05-30 16:20:00 |
Presentation Time |
60 minutes |
Registration for |
VLD |
Paper # |
VLD2012-5 |
Volume (vol) |
vol.112 |
Number (no) |
no.71 |
Page |
pp.25-30 |
#Pages |
6 |
Date of Issue |
2012-05-23 (VLD) |
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