| IEICE Technical Committee Submission System Conference Paper's Information |
Online Proceedings [Sign in] Tech. Rep. Archives |
| Go Top Page | Go Previous | [Japanese] / [English] |
| Paper Abstract and Keywords | ||
| Presentation | 2010-12-16 15:10 [Poster Presentation] A 65nm CMOS High-Speed and High-Fidelity NBTI Recovery Sensor Takashi Matsumoto, Hiroaki Makino (Kyoto Univ.), Kazutoshi Kobayashi (Kyoto Inst. Tech.), Hidetoshi Onodera (Kyoto Univ.)  ICD2010-104 Link to ES Tech. Rep. Archives: ICD2010-104 |
|
| Abstract | (in Japanese) | (See Japanese page) |
| (in English) | We proposed an NBTI-recovery sensor with 400ns measurement delay. This sensor contains many unit cells. One unit cell includes ten PMOS DUTs and two assist NMOSes. Parallelizing many unit cells can amplify the leakage current and the assist circuit can reduce the rush current to the ammeter that keeps the measurement range of ammeter constant during measurement. Fast measurement delay is achieved by these two factors. It is confirmed that from 50\(^\circ\)C to 125\(^\circ\)C, NBTI recovery follows log t from 400ns to 3000s. By degrading and recovering thousands of PMOS transistors at the same time, we can observe that the time constants of positively charged defects which are related to NBTI are log-uniformly distributed in the PMOS devices. Also this circuit has the highest fidelity to NBTI recovery measurement because off-leak current is used for NBTI recovery characterization and stress is not added during measurement. |
|
| Keyword | (in Japanese) | (See Japanese page) |
| (in English) | dependable VLSI / CMOS / NBTI / / / / / | |
| Reference Info. | IEICE Tech. Rep., vol. 110, no. 344, ICD2010-104, pp. 55-58, Dec. 2010. | |
| Paper # | ICD2010-104 | |
| Date of Issue | 2010-12-09 (ICD) | |
| ISSN | Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380 | |
| Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) | |
| Download PDF | ICD2010-104 Link to ES Tech. Rep. Archives: ICD2010-104 |
|
| Conference Information | |
| Committee | ICD |
| Conference Date | 2010-12-16 - 2010-12-17 |
| Place (in Japanese) | (See Japanese page) |
| Place (in English) | RCAST, Univ. of Tokyo |
| Topics (in Japanese) | (See Japanese page) |
| Topics (in English) | Workshop for Graduate Student and Young Researchers |
| Paper Information | |
| Registration To | ICD |
| Conference Code | 2010-12-ICD |
| Language | Japanese |
| Title (in Japanese) | (See Japanese page) |
| Sub Title (in Japanese) | (See Japanese page) |
| Title (in English) | A 65nm CMOS High-Speed and High-Fidelity NBTI Recovery Sensor |
| Sub Title (in English) | |
| Keyword(1) | dependable VLSI |
| Keyword(2) | CMOS |
| Keyword(3) | NBTI |
| Keyword(4) | |
| Keyword(5) | |
| Keyword(6) | |
| Keyword(7) | |
| Keyword(8) | |
| 1st Author's Name | Takashi Matsumoto |
| 1st Author's Affiliation | Kyoto University (Kyoto Univ.) |
| 2nd Author's Name | Hiroaki Makino |
| 2nd Author's Affiliation | Kyoto University (Kyoto Univ.) |
| 3rd Author's Name | Kazutoshi Kobayashi |
| 3rd Author's Affiliation | Kyoto Institute of Technology (Kyoto Inst. Tech.) |
| 4th Author's Name | Hidetoshi Onodera |
| 4th Author's Affiliation | Kyoto University (Kyoto Univ.) |
| 5th Author's Name | |
| 5th Author's Affiliation | () |
| 6th Author's Name | |
| 6th Author's Affiliation | () |
| 7th Author's Name | |
| 7th Author's Affiliation | () |
| 8th Author's Name | |
| 8th Author's Affiliation | () |
| 9th Author's Name | |
| 9th Author's Affiliation | () |
| 10th Author's Name | |
| 10th Author's Affiliation | () |
| 11th Author's Name | |
| 11th Author's Affiliation | () |
| 12th Author's Name | |
| 12th Author's Affiliation | () |
| 13th Author's Name | |
| 13th Author's Affiliation | () |
| 14th Author's Name | |
| 14th Author's Affiliation | () |
| 15th Author's Name | |
| 15th Author's Affiliation | () |
| 16th Author's Name | |
| 16th Author's Affiliation | () |
| 17th Author's Name | |
| 17th Author's Affiliation | () |
| 18th Author's Name | |
| 18th Author's Affiliation | () |
| Speaker | Author-1 |
| Date Time | 2010-12-16 15:10:00 |
| Presentation Time | 120 minutes |
| Registration for | ICD |
| Paper # | ICD2010-104 |
| Volume (vol) | vol.110 |
| Number (no) | no.344 |
| Page | pp.55-58 |
| #Pages | 4 |
| Date of Issue | 2010-12-09 (ICD) |
[Return to Top Page]