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Paper Abstract and Keywords
Presentation 2005-01-25 11:30
A Discussion on Fault Tolerance of Dynamic Reconfigurable Device
Naoki Ochi, Kentaro Nakahara, Futoshi Morie, Shin'ichi Kouyama, Tomonori Izumi, Hiroyuki Ochi, Yukihiro Nakamura (Kyoto Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) Reconfigurable logic devices are expected to be key devices for systems in severe environment such as spacecrafts, satellites, nuclear power plants and so on, since a system with such devices can be updated remotely
by uploading new configuration data and, even for the case of physical defects, may be recovered by reconfiguration excluding faulty parts. However, in order to utilize reconfigurable devices in such a severe environment, we have to cope with logical defects of configuration data. Our goal is to enhance fault tolerance of dynamic reconfigurable systems especially to logical defects in configuration data. In this paper, we review previous works on fault tolerance of reconfigurable systems. Then, we discuss on frameworks of device architectures to enhance fault tolerance. We propose two types of architectures, one based on majority voting, and the other based on error-correcting codes. Both of them correct faults in configuration data autonomously utilizing the ability of dynamic reconfiguration.
Keyword (in Japanese) (See Japanese page) 
(in English) Fault tolerance / Dynamic reconfigurable device / Single event upset(SEU) / Error correction / Multiplex / / /  
Reference Info. IEICE Tech. Rep., vol. 104, no. 591, CPSY2004-67, pp. 23-28, Jan. 2005.
Paper # CPSY2004-67 
Date of Issue 2005-01-18 (VLD, CPSY) 
ISSN Print edition: ISSN 0913-5685
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Conference Information
Committee CPSY VLD IPSJ-SLDM  
Conference Date 2005-01-25 - 2005-01-26 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English) FPGA and its Application, etc 
Paper Information
Registration To CPSY 
Conference Code 2005-01-CPSY-VLD-IPSJ-SLDM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Discussion on Fault Tolerance of Dynamic Reconfigurable Device 
Sub Title (in English)  
Keyword(1) Fault tolerance  
Keyword(2) Dynamic reconfigurable device  
Keyword(3) Single event upset(SEU)  
Keyword(4) Error correction  
Keyword(5) Multiplex  
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Keyword(7)  
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1st Author's Name Naoki Ochi  
1st Author's Affiliation Kyoto University (Kyoto Univ.)
2nd Author's Name Kentaro Nakahara  
2nd Author's Affiliation Kyoto University (Kyoto Univ.)
3rd Author's Name Futoshi Morie  
3rd Author's Affiliation Kyoto University (Kyoto Univ.)
4th Author's Name Shin'ichi Kouyama  
4th Author's Affiliation Kyoto University (Kyoto Univ.)
5th Author's Name Tomonori Izumi  
5th Author's Affiliation Kyoto University (Kyoto Univ.)
6th Author's Name Hiroyuki Ochi  
6th Author's Affiliation Kyoto University (Kyoto Univ.)
7th Author's Name Yukihiro Nakamura  
7th Author's Affiliation Kyoto University (Kyoto Univ.)
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Speaker Author-1 
Date Time 2005-01-25 11:30:00 
Presentation Time 30 minutes 
Registration for CPSY 
Paper # VLD2004-101, CPSY2004-67 
Volume (vol) vol.104 
Number (no) no.589(VLD), no.591(CPSY) 
Page pp.23-28 
#Pages
Date of Issue 2005-01-18 (VLD, CPSY) 


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