|
ˆÉ“¡G’j
- ˆÉ“¡G’jC’†“¹¼˜YF"Ž©ŒÈŒŸ¸‰Â”\‚È‚s‚l‚qƒVƒXƒeƒ€ŒŸ¸‰ñ˜H‚Ì\¬"C
“dŽq’ÊMŠw‰ï˜_•¶Ži‚cjCVol.J64-D, No.1, pp.31-38, 1981iº˜a56”N1ŒŽjD
-
ˆÉ“¡G’jC—é–ØMsF"ƒEƒF|ƒnƒXƒP|ƒ‹‚k‚r‚hã‚ł̃nƒCƒpƒLƒ…|ƒu‚Ì\¬–@"C
“dŽqî•ñ’ÊMŠw‰ï˜_•¶Ži‚c-IjCVol.J73-D-I, No.3, pp.314-323,1990i•½¬2”N 3 ŒŽj.
-
H.Ito:"A 2-Rail Logic Combinational Circuit for Easy Detection of Stuck-Open
and Stuck-On Faults in FETs", IEICE Tran. Inf. & Syst. Vol.E75-D, No.6,
pp.894-901,Nov. 1992D
|
