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藤原 秀雄
  1. H. Fujiwara and T. Shimono, "On the acceleration of test generation
    algorithms," IEEE Trans. on Computers, Vol. C-32, No. 12, pp. 1137-1144, Dec. 1983.


  2. H. Fujiwara, "Computational complexity of controllability/observability
    problems for combinational circuits," IEEE Trans. on Computers, Vol. 39,
    No. 6, pp762-767, June 1990.

  3. H. Fujiwara, "A new class of sequential circuits with combinational test
    generation complexity," IEEE Trans. on Computers, Vol. 49, No. 9, pp. 895-905, September 2000.





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