Special Issue on LSI Failure Analysis
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 . FOREWORD ........................................................ 527
        Shigeru NAKAJIMA

INVITED PAPERS
==============
 . Failure Analysis in Si Device Chips ............................. 528
        Kiyoshi NIKAWA

 . LSI Failure Analysis with CAD-Linked Electron Beam Test System and
   Its Evaluation .................................................. 535
        Hiromu FUJIOKA and Koji NAKAMAE

PAPERS
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 . Efficient Dynamic Fault Imaging by Fully Utilizing CAD Data in
   CAD-Linked Electron Beam Test System ............................ 546
        Koji NAKAMAE, Hirohisa TANAKA, Hideharu KUBOTA and Hiromu FUJIOKA

 . E-Beam Static Fault Imaging with a CAD Interface and Its Application
   to Marginal Fault Diagnosis ..................................... 552
        Norio KUJI and Kiyoshi MATSUMOTO

 . Cone/Block Methods for Logic Simulation Time Reduction in E-Beam
   Guided-Probe Diagnosis .......................................... 560
        Norio KUJI and Kazuhiro SHIRAKAWA

 . Matching of DUT Interconnection Pattern with CAD Layout in
   CAD-Linked Electron Beam Test System ............................ 567
        Koji NAKAMAE, Ryo NAKAGAKI, Katsuyoshi MIURA and Hiromu FUJIOKA

 . Optical Beam Induced Current Technique as a Failure Analysis Tool of
   EPROMs .......................................................... 574
        Jun SATOH, Hiroshi NAMBA, Tadashi KIKUCHI, Ken-ichi YAMADA,
        Hidetoshi YOSHIOKA, Miki TANAKA and Ken SHONO

 . An Analysis of and a Method of Enhancing the Intensity of OBIRCH
   Signal for Defects Observation in VLSI Metal Interconnections ... 579
        Naoki KAWAMURA, Tomoaki SAKAI and Masakazu SHIMAYA

 . Defect Detection of Passivation Layer by a Bias-Free Cu Decoration
   Method .......................................................... 585
        Tetsuaki WADA and Shinji NAKANO

 . Microstructure Analysis Technique of Specific Area by Transmission
   Electron Microscopy ............................................. 590
        Yoshifumi HATA, Ryuji ETOH, Hiroshi YAMASHITA, Shinji FUJII and
        Yoshikazu HARADA

 . ESR Study of MOSFET Characteristics Degradation Mechanism by Water
   in Intermetal Oxide ............................................. 595
        Kazunari HARADA, Naoki HOSHINO, Mariko Takayanagi TAKAGI and
        Ichiro YOSHII

Regular Section
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PAPERS
======
[Integrated Electronics]

 . A Proposal of New Multiple-Valued Mask-ROM Design ............... 601
        Yasushi KUBOTA, Shinji TOYOYAMA, Yoji KANIE and Shuhei
        TSUCHIMOTO

 . Measuring AC Emitter and Base Series Resistances in Bipolar
   Transistors ..................................................... 608
        Youichiro NIITS

[Electronic Circuits]

 . Experimental Design of a 32-bit Fully Asynchronous Microprocessor
   (FAM) ........................................................... 615
        Kyoung-Rok CHO, Kazuma OKURA and Kunihiro ASADA

[Opto-Electronics]

 . Taper-Shape Dependence of Tapered-Waveguide Traveling Wave
   Semiconductor Laser Amplifier (TTW-SLA) ......................... 624
        Syamsul EL YUMIN, Kazuhiro KOMORI, Shigehisa ARAI and Giampaolo 
        BENDELLI

[Microwave and Millimeter Wave Technology]

 . An Improve Reflection Wave Method for Measurement of Complex
   Permittivity at 100 MHz-1GHz .................................... 633
        Akira NAKAYAMA and Kazuya SHIMIZU

[Electromagnetic Theory]

 . Ray-Optical Techniques in Dielectric Waveguides ................. 639
        Masahiro HASHIMOTO and Hiroyuki HASHIMOTO

LETTERS
=======
[Electronic Circuits]

 . 4-2 Compressor with Complementary Pass-Transistor Logic ......... 647
        Youji KANIE, Yasushi KUBOTA, Shinji TOYOYAMA, Yasuaki IWASE and
        Shuhei TSUCHIMOTO

 . ABSTRACTS (Trans.IEICE, Vol.J77-C-‡T, J77-C-‡U, No.4 in Japanese)
            ........................................................ 650